Abstrait

SSIM Technique for Comparison of Images

Anil Wadhokar , Krupanshu Sakharikar , Sunil Wadhokar , Geeta Salunke

Now days there are different methods are present for evaluation of features of images, but there is no common effort developed for the comparison of the quality of image. We, in this paper are interested in quality evaluation of images so we are capturing the images from different cameras. The cameras we are using are of different configurations, specification and companies. The first work here is to capture the same scene with different cameras. While capturing the image, image can be affect by different types of distortion which we are discussing in this paper. The next step is to extract the special features of images. There are several features on the basis of which we can compare the quality of images. These features are contrast, luminance, edge base structure index, structural similarity(SSIM) etc. For advancement as we are extracting features of image and for quality improvement we are processing image with techniques for better result. Hence we can get the best quality image on the basis of comparison.